SIGLENT introduces the SAP8000D Active Differential Probe, designed to address the challenges of high-speed signal characterization and RF testing.

Featuring 8 GHz bandwidth and ultra-low 300 fF input capacitance, the SAP8000D minimizes probe loading effects while preserving signal integrity in demanding measurement environments. The probe supports both differential and single-ended measurements and provides high common-mode rejection for improved measurement accuracy.

The SAP8000D is well suited for high-speed serial bus validation, signal integrity analysis, and high-frequency circuit debugging across applications including PCIe, DDR, USB 3.0, and Gigabit Ethernet.

To accommodate a wide range of test setups, the probe supports multiple probing methods, including solder-in, handheld, and fixture-based configurations, and is compatible with various probe accessories. This flexible design enables engineers to perform reliable measurements in complex test environments with greater confidence.

By combining high bandwidth, low input capacitance, and versatile connectivity options, the SAP8000D provides an effective solution for next-generation high-speed and RF measurement challenges.