{"version":"1.0","provider_name":"Siglent Website","provider_url":"https:\/\/www.siglent.com\/fr\/","author_name":"Zhou, Vera","author_url":"https:\/\/www.siglent.com\/fr\/author\/vera-zhou\/","title":"Caract\u00e9risation et mesure des propri\u00e9t\u00e9s di\u00e9lectriques - Siglent Website","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"Gvxj22NZsB\"><a href=\"https:\/\/www.siglent.com\/fr\/caracterisation-et-mesure-des-proprietes-dielectriques\/\">Caract\u00e9risation et mesure des propri\u00e9t\u00e9s di\u00e9lectriques<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/www.siglent.com\/fr\/caracterisation-et-mesure-des-proprietes-dielectriques\/embed\/#?secret=Gvxj22NZsB\" width=\"600\" height=\"338\" title=\"\u00ab\u00a0Caract\u00e9risation et mesure des propri\u00e9t\u00e9s di\u00e9lectriques\u00a0\u00bb &#8212; Siglent Website\" data-secret=\"Gvxj22NZsB\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script>\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/www.siglent.com\/wp-includes\/js\/wp-embed.min.js\n<\/script>\n","thumbnail_url":"https:\/\/www.siglent.com\/wp-content\/uploads\/2024\/09\/\u6750\u6599\u4ecb\u7535\u7279\u6027.jpg","thumbnail_width":840,"thumbnail_height":460,"description":"Situations Created with Pixso. Obtenir un devis Caract\u00e9risation et mesure des propri\u00e9t\u00e9s di\u00e9lectriques La mesure mat\u00e9rialis\u00e9e est une t\u00e2che indispensable dans la recherche et le d\u00e9veloppement des applications de radiofr\u00e9quence (RF) et de micro-ondes. Dans de nombreux domaines diff\u00e9rents, comme la conception de circuits imprim\u00e9s, la conception de circuits pour micro-ondes, la science des mat\u00e9riaux, [&hellip;]"}