1.0Siglent Websitehttps://www.siglent.com/my/Zhou, Verahttps://www.siglent.com/my/author/vera-zhou/rich600338<blockquote class="wp-embedded-content" data-secret="nIC2ULa8hj"><a href="https://www.siglent.com/my/characterization-and-measurement-of-dielectric-properties/">Characterization and Measurement of Dielectric Properties</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://www.siglent.com/my/characterization-and-measurement-of-dielectric-properties/embed/#?secret=nIC2ULa8hj" width="600" height="338" title="“Characterization and Measurement of Dielectric Properties” — Siglent Website" data-secret="nIC2ULa8hj" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script> /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); //# sourceURL=https://www.siglent.com/wp-includes/js/wp-embed.min.js </script> https://www.siglent.com/wp-content/uploads/2024/09/材料介电特性.jpg840460Cases Characterization and Measurement of Dielectric Properties Material measurement is a must-do task in the research and development of radio frequency (RF) and microwave frequency applications. Across diverse fields including printed circuit board (PCB) design, microwave circuit design, materials science, biological research, automotive engineering, and metrology laboratories, precise characterization of various materials is essential for […]