Promotions

Unlock Full SigVSA Power with SDS7000A Series Oscilloscopes

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Purchase the RFA option for the SDS7000A Series Digital Storage Oscilloscope and receive the complete set of embedded SigVSA features at no additional cost. The embedded SigVSA runs directly on the SDS7000A oscilloscope, delivering seamless, high-performance vector signal analysis of DDC output data without the need for external equipment.

Notes:

    • Even if you already own an SDS7000A oscilloscope, simply purchasing the RFA option still qualifies you for this promotion.
      • New purchasers of SDS7000A + RFA
      • Existing SDS7000A owners purchasing the RFA option
    • This promotion applies only to the embedded SigVSA functions installed on the SDS7000A instrument. SigVSA-PC (standalone PC software) is not part of this offer.
Product Releases

SIGLENT Launches 8 GHz Active Differential Probe for High-Speed and RF Applications

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SIGLENT introduces the SAP8000D Active Differential Probe, designed to address the challenges of high-speed signal characterization and RF testing.

Featuring 8 GHz bandwidth and ultra-low 300 fF input capacitance, the SAP8000D minimizes probe loading effects while preserving signal integrity in demanding measurement environments. The probe supports both differential and single-ended measurements and provides high common-mode rejection for improved measurement accuracy.

The SAP8000D is well suited for high-speed serial bus validation, signal integrity analysis, and high-frequency circuit debugging across applications including PCIe, DDR, USB 3.0, and Gigabit Ethernet.

To accommodate a wide range of test setups, the probe supports multiple probing methods, including solder-in, handheld, and fixture-based configurations, and is compatible with various probe accessories. This flexible design enables engineers to perform reliable measurements in complex test environments with greater confidence.

By combining high bandwidth, low input capacitance, and versatile connectivity options, the SAP8000D provides an effective solution for next-generation high-speed and RF measurement challenges.

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