February 27, 2026 — SIGLENT Technologies releases SMM3000X Series Source/Measure Unit (SMU). SMM3000X features 6½-digit resolution, output capability of up to ±210 V DC voltage, ±3.03 A DC current, and ±10.5 A pulsed current, with programming and measurement resolution down to 10 fA / 100 nV, and a maximum acquisition rate of 100,000 points/s.

The SMM3000X supports four-quadrant operation, enabling simultaneous sourcing and measurement for closed-loop source–measure operations on DUTs. It can function as a voltage source, current source, voltmeter, ammeter, and ohmmeter, and also supports pulse generation and arbitrary waveform output, making it an ideal platform for characterizing semiconductors and other nonlinear devices and materials.

High-Accuracy Pulse Simulation

In pulse mode, the SMM3000X series supports pulsed current output up to ±10.5 A, with a minimum pulse width of 50 μs. This allows precise emulation of transient operating conditions of power devices, such as switching loss testing for GaN and SiC devices, providing strong support for R&D and validation of wide-bandgap power semiconductors.

Linear and Log Sweep Functions

The SMM3000X supports linear, log and pulsed sweep modes. Users can define start and stop values with fixed step sizes to source voltage or current point-by-point, while automatically measuring and logging each data point. This enables fast characterization of devices such as diodes and transistors, allowing engineers to extract I-V curves and analyze conduction behavior under different operating conditions.

Flexible User-Defined Sequences

List mode allows users to define custom output sequences with minimum timing resolution down to 10 μs. Parameter changes can be linear, non-linear, arbitrary, or user-ordered. The SMM3000X outputs voltage or current according to the defined list while synchronously measuring and recording data—ideal for non-uniform sweeps, multi-segment tests, and complex stimulus profiles.

Data Visualization and Analysis

The SMM3000X series provides multiple display modes including Graph, Roll, and Measure views.

• Graph View enables real-time plotting of mathematical results.
• Roll View displays time-domain waveforms of acquired data.
• Measure View provides statistical analysis of traces.

These views offer multi-dimensional insight into test results, making data interpretation and debugging more intuitive.

Efficient Remote Programming and Control

Based on an advanced SCPI command set, the SMM3000X supports USB and LAN interfaces for seamless PC connectivity and automation. Users can operate the instrument via a built-in web interface or implement deep custom control using SCPI scripting. In addition, TCP/IP Socket communication is supported for flexible network-based test control and integration into automated test systems.

The SMM3000X series is designed to meet the precision testing needs of third-generation semiconductors, advanced optoelectronic devices, and emerging materials, while also significantly accelerating development cycles for new energy batteries and high-density integrated circuits. By improving both test efficiency and measurement accuracy, provides a powerful foundation for new product development and innovation.