Siglent Launches SNA5000X-E Vector Network Analyzer
Compact, Cost-Effective 6.5 GHz VNA Delivering High Performance for R&D and Production
Siglent Technologies officially announces the release of the SNA5000X-E Vector Network Analyzer, a compact and cost-effective solution designed to meet essential RF testing requirements without compromising performance. Covering a frequency range from 9 kHz to 6.5 GHz and delivering a typical dynamic range of 125 dB, the SNA5000X-E provides accurate, reliable measurements for R&D, education, and production environments.
Positioned as an entry-level model within the SNA5000 series, the SNA5000X-E retains the core performance architecture of the SNA5000A family while offering enhanced cost-effectiveness for standard vector network analysis applications. It supports 1 Hz frequency resolution, adjustable IF bandwidth from 1 Hz to 10 MHz, and an output power range from –40 dBm to +10 dBm. With its 125 dB typical dynamic range, the instrument maintains excellent measurement stability and accuracy even in complex RF test scenarios.
The SNA5000X-E supports comprehensive S-parameter and differential measurements, along with integrated time-domain analysis, enhanced time-domain analysis, and spectrum analysis functions. These capabilities enable engineers to evaluate frequency-domain characteristics, analyze impedance discontinuities, and quickly locate faults within devices under test. A built-in eye diagram function further supports high-speed signal integrity analysis, improving debugging efficiency during development.
To address fixture-induced measurement errors commonly encountered in RF testing, the SNA5000X-E incorporates automatic fixture removal, port extension, de-embedding, and impedance conversion functions. These tools effectively compensate for cable delay and loss, minimizing systematic errors and ensuring high confidence in measurement results.
Designed for modern laboratories and production lines, the SNA5000X-E features a compact form factor with an instrument depth of only 12.6 cm and a weight of less than 5.4 kg. This significantly reduces workspace requirements compared to traditional network analyzers. The instrument is equipped with a 12.1-inch touchscreen that supports multi-window display and multiple data formats, creating an intuitive and efficient operating experience.
For production and automated test environments, the SNA5000X-E offers one-click filter characteristic analysis to quickly obtain key parameters such as insertion loss and bandwidth. It also supports custom formula operations and remote control via SCPI and WebServer, enabling seamless integration into automated systems and helping standardize and streamline testing workflows.
By returning to the fundamentals of vector network analysis, the SNA5000X-E combines essential performance, intelligent operation, and compact design in an economical solution. It provides a reliable, one-stop platform for applications ranging from R&D validation to batch quality inspection, enabling engineers to achieve professional RF measurement capability with optimized investment.
SIGLENT releases SMM3000X Series Source/Measure Unit (SMU)
SIGLENT Launches SMM3000X Series Source/Measure Unit
February 27, 2026 — SIGLENT Technologies releases SMM3000X Series Source/Measure Unit (SMU). SMM3000X features 6½-digit resolution, output capability of up to ±210 V DC voltage, ±3.03 A DC current, and ±10.5 A pulsed current, with programming and measurement resolution down to 10 fA / 100 nV, and a maximum acquisition rate of 100,000 points/s.
The SMM3000X supports four-quadrant operation, enabling simultaneous sourcing and measurement for closed-loop source–measure operations on DUTs. It can function as a voltage source, current source, voltmeter, ammeter, and ohmmeter, and also supports pulse generation and arbitrary waveform output, making it an ideal platform for characterizing semiconductors and other nonlinear devices and materials.
High-Accuracy Pulse Simulation
In pulse mode, the SMM3000X series supports pulsed current output up to ±10.5 A, with a minimum pulse width of 50 μs. This allows precise emulation of transient operating conditions of power devices, such as switching loss testing for GaN and SiC devices, providing strong support for R&D and validation of wide-bandgap power semiconductors.
Linear and Log Sweep Functions
The SMM3000X supports linear, log and pulsed sweep modes. Users can define start and stop values with fixed step sizes to source voltage or current point-by-point, while automatically measuring and logging each data point. This enables fast characterization of devices such as diodes and transistors, allowing engineers to extract I-V curves and analyze conduction behavior under different operating conditions.
Flexible User-Defined Sequences
List mode allows users to define custom output sequences with minimum timing resolution down to 10 μs. Parameter changes can be linear, non-linear, arbitrary, or user-ordered. The SMM3000X outputs voltage or current according to the defined list while synchronously measuring and recording data—ideal for non-uniform sweeps, multi-segment tests, and complex stimulus profiles.
Data Visualization and Analysis
The SMM3000X series provides multiple display modes including Graph, Roll, and Measure views.
- Graph View enables real-time plotting of mathematical results.
- Roll View displays time-domain waveforms of acquired data.
- Measure View provides statistical analysis of traces.
These views offer multi-dimensional insight into test results, making data interpretation and debugging more intuitive.
Efficient Remote Programming and Control
Based on an advanced SCPI command set, the SMM3000X supports USB and LAN interfaces for seamless PC connectivity and automation. Users can operate the instrument via a built-in web interface or implement deep custom control using SCPI scripting. In addition, TCP/IP Socket communication is supported for flexible network-based test control and integration into automated test systems.
The SMM3000X series is designed to meet the precision testing needs of third-generation semiconductors, advanced optoelectronic devices, and emerging materials, while also significantly accelerating development cycles for new energy batteries and high-density integrated circuits. By improving both test efficiency and measurement accuracy, provides a powerful foundation for new product development and innovation.
